微观组织的分析电子显微学表征 英文版2025|PDF|Epub|mobi|kindle电子书版本百度云盘下载

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Chapter 1 Analytical Electron Microscope(AEM)1

1.1 Brief introduction of AEM history2

1.2 Interaction between electrons and specimen and signals used by AEM3

1.3 Electron wavelength and electromagnetic lens4

1.3.1 Electron wavelength4

1.3.2 Electromagnetic lens5

1.4 Structure and function of AEM11

1.4.1 Illumination system12

1.4.2 Specimen holders18

1.4.3 Imaging system19

1.4.4 Image recording20

1.4.5 Power supply system and vacuum system23

1.4.6 Computer control25

1.5 The principle of imaging,magnifying and diffracting26

1.6 Theoretical resolution limit29

1.7 Depth of focus and depth of field31

1.8 Spherical aberration-corrected TEMs33

References35

Chapter 2 Specimen Preparation37

2.1 Traditional techniques38

2.1.1 Replica38

2.1.2 Preparation of powders42

2.1.3 Film preparation for plan view43

2.1.4 Film preparation from a bulk metallic sample44

2.1.5 Film preparation from a bulk nonmetallic sample52

2.2 Special techniques56

2.2.1 Cross-sectional specimen preparation56

2.2.2 Cleaving and small angle cleavage technique60

2.2.3 Ultramicrotomy62

2.2.4 Focused ion beam technique63

References66

Chapter 3 Electron Diffraction67

3.1 Comparison of electron diffraction with X-ray diffraction68

3.2 Conditions of diffraction69

3.2.1 Geometric condition69

3.2.2 Physical condition72

3.2.3 Diffraction deviating from exact Bragg condition74

3.3 Basic equation used for analysis of electron diffraction pattern76

3.3.1 Diffraction in an electron diffractometer76

3.3.2 Diffraction in a TEM78

3.4 Principle and operation of selected area electron diffraction81

3.5 Rotation of image relative to diffraction pattern83

3.6 Diffraction patterns of polycrystal and their applications84

3.6.1 Formation and geometric features of diffraction patterns for polycrystal85

3.6.2 Applications of ring patterns87

3.7 Geometric features of diffraction patterns of single crystals88

3.7.1 Geometric features and diffraction intensity of a single crystal pattern89

3.7.2 Indexing methods of single crystal diffraction patterns93

3.8 Main applications of single crystal pattern97

3.8.1 Identification of phases97

3.8.2 Determination of orientation relationship101

3.9 Diffraction spot shift by stacking faults and determination of stacking fault probability103

3.9.1 Diffraction from planar defect103

3.9.2 Determination of stacking fault probability in HCP crystal104

3.9.3 Determination of stacking fault probability in FCC crystal108

3.10 Systematic tilting technique and its applications114

3.10.1 Systematic tilting technique by double tilt holder115

3 10.2 Determination of electron beam direction117

3.10.3 Determination of misorientation axis/angle pair119

3.10.4 Determining phase using reconstruction of reciprocal lattice122

3.10.5 Trace analysis125

3.10.6 Unambiguity of orientation determination130

3.11 Characteristics and indexing of complex electron diffraction patterns134

3.11.1 Diffraction patterns with the orientation relationship between two phases134

3.11.2 Twin diffraction pattern135

3.11.3 High order Laue diffraction pattern138

3.11.4 Superlattice diffraction pattern146

3.11.5 Double diffraction pattern147

3.11.6 Moiré patterns151

3.11.7 Diffraction pattern of modulated structure153

3.11.8 Long-period stacking order structures and their diffraction patterns154

3.11.9 Kikuchi line pattern161

References169

Chapter 4 Mathematics Analysis in Electron Diffraction and Crystallography171

4.1 Transformation matrices of orientation relationships171

4.1.1 Introduction to matrix analysis171

4.1.2 Prediction of an arbitrary zone of diffraction pattern based on orientation relationship173

4.1.3 Transformation matrices for indices of direction and plane in different coordinate systems188

4.1.4 Mathematics description of characteristics parameters of coincidence site lattice192

4.1.5 Transformation matrix of twinning orientation relationship196

4.2 Prediction of orientation relationships204

4.2.1 Introduction204

4.2.2 Edge-to-edge matching205

4.2.3 Invariant line strain model228

4.2.4 O-line model236

4.3 Systematic extinction caused by crystallographic symmetry254

4.3.1 Symmetry elements and their corresponding operation matrices254

4.3.2 Combination laws of macro-symmetry elements258

4.3.3 Derivations of the point groups and their transition matrices261

4.3.4 Relationships between point groups,crystal systems and Bravais lattices268

4.3.5 Translational symmetry elements in space groups271

4.3.6 Equivalent positions273

4.3.7 Two dimensional lattice,plane point groups and plane groups275

4.3.8 Symmetry of electron diffraction patterns280

4.3.9 Systematic extinction281

4.3.10 Example of determining crystal structures by crystal symmetry analysis285

References291

Chapter 5 Diffraction Contrast295

5.1 Classification of electron image contrasts and imaging modes295

5.1.1 Imaging principles of mass-thickness contrast296

5.1.2 Principle of diffraction contrast imaging300

5.1.3 Imaging principle of phase contrast304

5.2 Kinematical theory of diffraction contrast304

5.2.1 Basic assumption and approximate treatment305

5.2.2 Kinematical equation of diffraction contrast for perfect crystals309

5.2.3 Thickness fringes and bend contours311

5.2.4 Kinematical equation of diffraction contrast for imperfect crystals314

5.2.5 Determination of natures of stacking fault and dislocation by diffraction contrast316

5.3 Dynamical theory of diffraction contrast(wave-optical formulation)348

5.3.1 Scattering of electrons from atoms348

5.3.2 Dynamical equation and diffraction contrast for perfect crystals351

5.3.3 Solution of the equations of the dynamical theory in perfect crystals355

5.3.4 Bend contours and thickness fringes359

5.3.5 Anomalous absorption effect364

5.3.6 Dynamical equations of diffracted contrast for an imperfect crystal368

5.3.7 Example of computer simulation of dislocations based on two-beam dynamical theory373

References377

Chapter 6 High Resolution and High Spatial Resolution of Analytical Electron Microscopy379

6.1 HRTEM and its applications380

6.1.1 Electron scattering380

6.1.2 Fourier transform and convolution382

6.1.3 Two important functions describing the formation of high resolution images388

6.1.4 Direct explanation of high resolution image for WPOA394

6.1.5 High resolution images of thick crystal specimens400

6.1.6 Application examples of high resolution images408

6.2 CBED and its applications424

6.2.1 Formation and features of CBED patterns424

6.2.2 Identification of crystal symmetry432

6.2.3 Determination of carbon content by CBED444

6.2.4 CBED for strain determination at the nanoscale447

6.3 EDS and its quantitative microanalysis449

6.3.1 Characteristic X-rays and their detection449

6.3.2 Quantitative analysis454

6.3.3 Spatial resolution and detection limits456

6.4 EELS and its quantitative microanalysis457

6.4.1 Electron energy loss spectrometer458

6.4.2 EELS spectrum459

6.5 Brief introduction to advanced AEMs467

6.5.1 Negative Cs imaging(NCSI)technique467

6.5.2 Atomic resolution Z-contrast imaging technique473

6.5.3 Electron holography481

References488

Appendix491

A.1 Physical constants and conversion factors491

A.2 Geometrical relationships of crystals492

A.3 Table of angles between planes(or directions)of cubic crystal494

A.4 Electron diffraction patterns(EDPs)of FCC,BCC and HCP503

A.5 Standard high order Laue diffraction patterns of FCC,BCC and HCP509

A.6 Eight kinds of typical crystal structures515

A.7 Stereographic projections of cubic and hexagonal systems(c/a=1.633)516

A.8 Relationship of parameters of coincidence site lattice(CSL)in cubic crystal526

A.9 Table of atomic scattering factors532

A.10 Table of characteristic X-ray's wavelength(A)and energy(keV)539

A.11 Table of electron binding energy for electron energy loss spectroscopy(EELS)542

References544

Index545